Electronic interactions at SiO2/M′Ox (M′: Al, Ti) oxide interfaces

Surface Science

Volumn 482-485, Issue PART 1, 2001, Pages 680-686

  Barranco, A ^a   Yubero, F ^a   Mejias J A ^b   Espinos J P ^a   Gonzalez Elipe A R ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA   (Spain)

^b UNIVERSIDAD PABLO DE OLAVIDE   (Spain)

Author keywords

Auger electron spectroscopy; Silicon oxides; Surface electronic phenomena (work function, surface potential, surface states, etc.); X ray photoelectron spectroscopy

Indexed keywords

ALUMINA; AUGER ELECTRON SPECTROSCOPY; BINDING ENERGY; PHOTOEMISSION; SILICA; SURFACE PHENOMENA; TITANIUM OXIDES; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRONIC INTERACTIONS; SURFACE ELECTRONIC PHENOMENA;

INTERFACES (MATERIALS);

EID: 0035918954     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)01011-6     Document Type: Conference Paper

References (25)