Interband transitions of crystalline and amorphous SiO2: An electron energy-loss spectroscopy (EELS) study of the low-loss region

Solid State Communications

Volumn 106, Issue 5, 1998, Pages 303-307

  Garvie, L A J ^a   Rez, P ^a   Alvarez, J R ^a   Buseck, P R ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

A. insulators; D. dielectric response; E. electron energy loss spectroscopy; Electronic band structure

Indexed keywords

AMORPHOUS MATERIALS; BAND STRUCTURE; CALCULATIONS; CRYSTALLINE MATERIALS; DIELECTRIC PROPERTIES; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC DENSITY OF STATES; INSULATING MATERIALS; SILICA; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

DIELECTRIC RESPONSE; INTERBAND TRANSITION; PSEUDOPOTENTIAL METHOD;

ELECTRON TRANSITIONS;

EID: 0032064355     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(98)00021-0     Document Type: Article

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