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Volumn 18, Issue 5, 2000, Pages 2384-2388
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The deposition behavior of SiO2-TiO2 thin film by metalorganic chemical vapor deposition method
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVATION ENERGY;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
REFRACTIVE INDEX;
SILICA;
TITANIUM DIOXIDE;
LORENTZ-LORENZ MODEL;
THIN FILMS;
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EID: 0034272641
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (22)
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References (33)
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