An inverse problem solution for undetermined electrostatic force microscopy setups using neural networks

Nanotechnology

Volumn 20, Issue 8, 2009, Pages

  Sacha, G M ^a   Rodriguez F B ^a   Varona, P ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL NEURAL NETWORKS; DIELECTRIC CONSTANTS; ELECTROSTATIC FORCE MICROSCOPIES; ELECTROSTATIC INTERACTIONS; EXPERIMENTAL DATUM; FREE PARAMETERS; GENERALIZED IMAGE CHARGE METHODS; INVERSE PROBLEM SOLUTIONS; METALLIC NANOWIRES; TIP SHAPES;

BACKPROPAGATION; CERAMIC CAPACITORS; DIELECTRIC WAVEGUIDES; ELECTROSTATIC FORCE; ELECTROSTATIC SEPARATORS; INVERSE PROBLEMS; NANOWIRES; PERMITTIVITY; SCANNING; SCANNING PROBE MICROSCOPY;

NEURAL NETWORKS;

NANOWIRE; METAL; NANOMATERIAL; NANOTUBE;

ARTICLE; ARTIFICIAL NEURAL NETWORK; CHEMICAL INTERACTION; DIELECTRIC CONSTANT; ELECTRICITY; MATHEMATICAL COMPUTING; MICROSCOPY; NANOTECHNOLOGY; PRIORITY JOURNAL; SCANNING PROBE MICROSCOPY; ALGORITHM; ATOMIC FORCE MICROSCOPY; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; MATERIALS TESTING; METHODOLOGY; STATIC ELECTRICITY; ULTRASTRUCTURE;

ALGORITHMS; COMPUTER SIMULATION; MATERIALS TESTING; METALS; MICROSCOPY, ATOMIC FORCE; MODELS, CHEMICAL; NANOSTRUCTURES; NANOTUBES; NEURAL NETWORKS (COMPUTER); STATIC ELECTRICITY;

EID: 65449123838     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/8/085702     Document Type: Article

References (33)

1. Jenke M G, Santschi C and Hoffmann P 2008 Appl. Phys. Lett. 92 063113
2. Williams C C, Hough W P and Rishton A 1989 Appl. Phys. Lett. 55 203
3. Hu J, Xiao X D and Salmeron M 1995 Appl. Phys. Lett. 67 476
4. Butt H J, Capella B and Kappl M 2005 Surf. Sci. Rep. 59 1
5. Colchero J, Gil A and Baro A M 2001 Phys. Rev. B 64 245403
6. Stark R W, Naujoks N and Stemmer A 2007 Nanotechnology 18 065502
7. Morozovska A N, Eliseev E A and Kalinin S V 2007 J. Appl. Phys. 102 074105
8. Verdaguer A, Sacha G M, Bluhm H and Salmeron M 2006 Chem. Rev. 106 1478
9. Sacha G M, Verdaguer A and Salmeron M 2006 J. Phys. Chem. B 110 14870
10. Gómez-Mõivas S, Senz J J, Calleja M and García R 2003 Phys. Rev. Lett. 91 056101
11. Konior J 2007 J. Appl. Phys. 101 084907
12. Jespersen T S and Nygard J 2007 Appl. Phys. Lett. 90 183108
13. Jortner J and Ratner M 1997 Molecular Electronics (Oxford: Blackwell)
14. Sheng Y X, Barnett D M and Pinsky P M 2008 Rev. Sci. Instrum. 79 023711
15. Strassburg E, Boag A and Rosenwaks Y 2005 Rev. Sci. Instrum. 76 083705
16. Gómez-Mõivas S, Carminati R, Greffet J J and Senz J J 2000 Appl. Phys. Lett. 76 2955
17. Sausse-Lhernould M, Delchambre A, Regnier S and Lambert P 2007 Appl. Surf. Sci. 253 6203
18. Sacha G M, Gómez-Navarro C, Senz J J and Gómez-Herrero J 2006 Appl. Phys. Lett. 89 173122
19. Lu W, Wang D and Cheng L 2007 Nano Lett. 7 2729
20. Girard P 2001 Nanotechnology 12 485
21. Sacha G M and Senz J J 2004 Appl. Phys. Lett. 85 2610
22. Sacha G M, Sahagn E and Senz J J 2007 J. Appl. Phys. 101 024310
23. Wang W L and Whitehouse D J 1995 Nanotechnology 6 45
24. Kim B, Kim S and Lee B T 2004 J. Vac. Sci. Technol. 22 2467
25. Gomez-Monivas S, Froufe L S, Carminati R, Greffet J J and Senz J J 2001 Nanotechnology 12 496
26. Hadjiiski L, Linnemann R, Stopka M, Oestershulze E, Rangelow I and Kassing R 1995 Thin Solid Films 264 291
27. Gómez-Mõivas S, Froufe L S, Caamão A J and Senz J J 2001 Appl. Phys. Lett. 79 4048
28. Haykin S 1999 Neural Networks (Englewood, NJ: Prentice-Hall)
29. Park J Y et al 2005 Phys. Rev. Lett. 95 136802
30. Palacios-Lidon E, Abelln J, Colchero J, Munuera C and Ocal C 2005 Appl. Phys. Lett. 87 154106
31. Rampi M A, Schueller O J and Whitesides G M 1998 Appl. Phys. Lett. 72 1781
32. Tetko I V, Livingstone D J and Luik A I 1995 J. Chem. Inf. Comput. Sci. 35 826
33. Sacha G M, Verdaguer A, Martínez J, Senz J J, Ogletree D F and Salmeron M 2005 Appl. Phys. Lett. 86 123101