An in situ investigation of electromigration in Cu nanowires

Nanotechnology

Volumn 20, Issue 7, 2009, Pages

  Huang, Qiaojian ^a   Lilley, Carmen M ^a   Divan, Ralu ^b  

^a 1120 Science and Engineering Offices   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER-ELECTRON SPECTRUM; CU ATOMS; CU NANOWIRES; ELECTRON BEAM EVAPORATIONS; IN-SITU; MASS TRANSPORTS; MEAN TEMPERATURES; RESISTANCE MEASUREMENTS; SURFACE CONTAMINANTS; WIRE SURFACES; WIRE WIDTHS;

ACTIVATION ENERGY; ATOMIC SPECTROSCOPY; AUGER ELECTRON SPECTROSCOPY; ELECTRIC WIRE; ELECTRON BEAMS; NANOWIRES; OXYGEN; SCANNING ELECTRON MICROSCOPY;

ELECTROMIGRATION;

CARBON; COPPER; NANOWIRE; OXYGEN;

ARTICLE; ATOM; AUGER ELECTRON SPECTROSCOPY; CONTROLLED STUDY; ELECTRIC CURRENT; ELECTRICITY; ELECTRON BEAM; ENERGY; EVAPORATION; MOLECULAR SIZE; OXYGEN TRANSPORT; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; TEMPERATURE; TRANSPORT KINETICS;

EID: 65349112131     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/7/075706     Document Type: Article

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