|
Volumn 30, Issue 1, 2000, Pages 278-282
|
In situ observation of electromigration in micrometre-sized gold stripes by scanning force microscopy
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ANODES;
CATHODES;
CURRENT DENSITY;
ELECTROMIGRATION;
EVAPORATION;
GOLD;
MASS TRANSFER;
MICROSCOPIC EXAMINATION;
MORPHOLOGY;
THERMAL EFFECTS;
THERMAL GRADIENTS;
THIN FILMS;
METALLIC STRIPES;
SCANNING FORCE MICROSCOPY;
METALLIC FILMS;
|
EID: 0034245030
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/1096-9918(200008)30:1<278::AID-SIA784>3.0.CO;2-Y Document Type: Article |
Times cited : (9)
|
References (15)
|