Perovskite CaCu3Ti4O12 thin films for capacitive applications: From the growth to the nanoscopic imaging of the permittivity

Journal of Applied Physics

Volumn 105, Issue 6, 2009, Pages

  Fiorenza, P ^a   Lo Nigro, R ^a   Sciuto, A ^a   Delugas, P ^a   Raineri, V ^a   Toro, R G ^b   Catalano, M R ^b   Malandrino, G ^b  

^a CNR   (Italy)

^b UNIVERSITY OF CATANIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC CONSTANTS; ELECTRICAL BEHAVIORS; ELECTRICAL MEASUREMENTS; EXTRINSIC BEHAVIORS; LOW DEFECT DENSITIES; METAL-ORGANIC CHEMICAL VAPOR DEPOSITIONS; NANOSCOPIC IMAGING; OPTICAL CHARACTERISTICS; WORK FREQUENCIES;

CALCIUM ALLOYS; DEFECT DENSITY; ELECTRODEPOSITION; EPITAXIAL FILMS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; ORGANIC CHEMICALS; ORGANOMETALLICS; OXIDE MINERALS; PERMITTIVITY; PEROVSKITE; SEMICONDUCTOR GROWTH;

SEMICONDUCTING FILMS;

EID: 63749125946     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3086198     Document Type: Article

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