Temperature behavior of inhomogeneous Pt/GaN Schottky contacts

Applied Physics Letters

Volumn 90, Issue 9, 2007, Pages

  Iucolano, Ferdinando ^a   Roccaforte, Fabrizio ^a   Giannazzo, Filippo ^a   Raineri, Vito ^a  

^a CNR IMM   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC PROPERTIES; PLATINUM COMPOUNDS; VOLTAGE MEASUREMENT;

HOMOGENEITY; LOCAL CURRENT VOLTAGE MEASUREMENTS; NANOSCALES; TEMPERATURE DEPENDENCE;

SCHOTTKY BARRIER DIODES;

EID: 33847683729     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2710770     Document Type: Article

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