Dielectric relaxation in pulsed laser ablated CaCu3Ti 4O12 thin film

Journal of Applied Physics

Volumn 100, Issue 3, 2006, Pages

  Srivastava, A ^a   Gupta, Vinay ^b   Sarkar, C K ^c   Das, R R ^d   Bhattacharya, P ^d   Katiyar, R S ^d  

^a BIRLA INSTITUTE OF TECHNOLOGY AND SCIENCE   (India)

^b UNIVERSITY OF DELHI   (India)

^c JADAVPUR UNIVERSITY   (India)

^d UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; DIELECTRIC RELAXATION; ELECTRIC CONDUCTIVITY; PERMITTIVITY; PULSED LASER DEPOSITION; RAMAN SPECTROSCOPY; THIN FILMS; X RAY DIFFRACTION;

AC CONDUCTIVITY; CRYSTALLOGRAPHIC STRUCTURE; DEBYE RELAXATION; SILICON SUBSTRATE;

CALCIUM COMPOUNDS;

EID: 33747369847     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2220881     Document Type: Article

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