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Volumn 127, Issue 40, 2005, Pages 13772-13773

Recent advances in characterization of CaCu3Ti4O 12 thin films by spectroscopic ellipsometric metrology

a CNR (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM COPPER TITANATE; CALCIUM DERIVATIVE; COPPER DERIVATIVE; NANOPARTICLE; PEROVSKITE; TITANIUM DERIVATIVE; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC FORCE MICROSCOPY; DIELECTRIC CONSTANT; ELLIPSOMETRY; EPISTASIS; FILM; SPECTROSCOPY; SYNTHESIS; X RAY DIFFRACTION;

CALCIUM; COPPER; MEMBRANES, ARTIFICIAL; MICROSCOPY, ATOMIC FORCE; OXYGEN; TITANIUM; X-RAY DIFFRACTION;

EID: 26444452611 PISSN: 00027863 EISSN: None Source Type: Journal
DOI: 10.1021/ja0541229 Document Type: Article

Times cited : (28)

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