Thickness-dependent microstructures and electrical properties of CaCu3Ti4O12 films derived from sol-gel process

Thin Solid Films

Volumn 516, Issue 2-4, 2007, Pages 454-459

  Chang, Li Chun ^a   Lee, Dai Ying ^b   Ho, Chia Cheng ^b   Chiou, Bi Shiou ^b  

^a HUAFAN UNIVERSITY   (Taiwan)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

CaCu3Ti4O12 (CCTO); Dielectric; Sol gel; Thickness dependent properties

Indexed keywords

CALCIUM COMPOUNDS; DIELECTRIC DEVICES; ELECTRIC PROPERTIES; FILM THICKNESS; MICROSTRUCTURE; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SURFACE MORPHOLOGY; THICKNESS CONTROL;

GRAZING; THICKNESS-DEPENDENT PROPERTIES;

THIN FILMS;

EID: 36049007121     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.07.009     Document Type: Article

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