Rapid roughening in thin film growth of an organic semiconductor (diindenoperylene)

Physical Review Letters

Volumn 90, Issue 1, 2003, Pages

  Durr A C ^a   Schreiber, F ^a,b,e   Ritley, K A ^a   Kruppa, V ^a   Krug, J ^c   Dosch, H ^a,b   Struth, B ^d  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

^c UNIVERSITY OF DUISBURG ESSEN   (Germany)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^e UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FILM GROWTH; GRAIN BOUNDARIES; REFLECTION; SEMICONDUCTING ORGANIC COMPOUNDS; SILICA; THIN FILMS; X RAY SCATTERING;

DIFFUSE X RAY SCATTERING; DIINDENOPERYLENE; X RAY REFLECTIVITY;

SURFACE ROUGHNESS;

EID: 0037428574     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (15)

1. F.-J. Meyer zu Heringdorf et al., Nature (London) 412, 517 (2001).
2. J. Krim and G. Palasantzas, Int. J. Mod. Phys. B 9, 599 (1995).
3. J. Krug, Adv. Phys. 46, 139 (1997).
4. G. W. Collins et al., Phys. Rev. Lett. 73, 708 (1994).
5. F. Biscarini et al., Phys. Rev. Lett. 78, 2389 (1997).
6. Y.-P. Zhao et al., Phys. Rev. Lett. 85, 3229 (2000).
7. V. Holý, U. Pietsch, and T. Baumbach, High-Resolution X-Ray Scattering From Thin Films and Multilayers (Springer, Berlin, 1999).
8. A. C. Dürr et al., Appl. Phys. Lett. 81, 2276 (2002).
9. G. Lengel et al., Phys. Rev. B 60, R8469 (1999).
10. K. J. Caspersen et al., Phys. Rev. B 65, 193407 (2002).
11. M. Kalff et al., Surf. Sci. 426, L447 (1999).
12. K. Fang et al., Phys. Rev. B 49, 8331 (1994).
13. C. J. Lanczycki et al., Phys. Rev. B 57, 13132 (1998).
14. J.-P. Schlomka et al., Appl. Phys. Lett. 76, 2005 (2000).
15. J. Krug, Phys. Rev. Lett. 75, 1795 (1995).