Synchrotron x-ray-diffraction study of the structure and growth of Xe films adsorbed on the Ag(111) surface

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 23, 1999, Pages 15464-15479

  Dai, Pengcheng ^a,c   Wu, Z ^a,d   Angot, T ^a,e   Wang, S K ^a,f   Taub, H ^a   Ehrlich, S N ^b  

^a UNIVERSITY OF MISSOURI   (United States)

^b PURDUE UNIVERSITY   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d United States of America   (United States)

^e UNIVERSITÉ DE HAUTE ALSACE   (France)

^f NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 16644370141     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.15464     Document Type: Article

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