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Volumn 96, Issue 5, 2006, Pages

Multiple time scales in diffraction measurements of diffusive surface relaxation

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; DIFFRACTION; DIFFUSION; RATE CONSTANTS; SCATTERING; X RAY SCATTERING;

DIFFRACTION MEASUREMENTS; FOURIER COMPONENTS; SURFACE FEATURES;

SURFACE PHENOMENA;

OXIDE; STRONTIUM; STRONTIUM TITANIUM OXIDE; TITANIUM;

ATOMIC FORCE MICROSCOPY; CHEMISTRY; FOURIER ANALYSIS; LASER; X RAY DIFFRACTION;

FOURIER ANALYSIS; LASERS; MICROSCOPY, ATOMIC FORCE; OXIDES; STRONTIUM; TITANIUM; X-RAY DIFFRACTION;

EID: 33144487890 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.96.055508 Document Type: Article

Times cited : (30)

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