Early stages of pentacene film growth on silicon oxide

Organic Electronics

Volumn 5, Issue 5, 2004, Pages 257-263

  Mayer, Alex C ^a   Ruiz, Ricardo ^a   Headrick, Randall L ^b   Kazimirov, Alexander ^c   Malliaras, George G ^a  

^a Department of Materials Science and Engineering   (United States)

^b UNIVERSITY OF VERMONT   (United States)

^c Department of Population Medicine and Diagnostic Sciences   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; DIELECTRIC MATERIALS; MONOLAYERS; SILICA; SILICON WAFERS; THIN FILM TRANSISTORS; X RAY SCATTERING;

DEIONIZED WATER; FIELD EFFECT MOBILITY; KIESSIG EFFECT; QUARTZ CRYSTAL MICROBALANCE (QCM);

SILICON COMPOUNDS;

EID: 4644235459     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2004.05.001     Document Type: Article

References (31)

1. Dimitrakopoulos C.D., Malenfant P.R.L. Advanced Materials. 14:2002;99-117.
2. Lin Y.Y., Gundlach D.J., Nelson S.F., Jackson T.N. IEEE Electron Device Letters. 18:1997;606-608.
3. Halik M., et al. Journal of Applied Physics. 93:2003;2977-2981.
4. Bonse M., Thomasson D.B., Klauk H., Gundlach D.J., Jackson T.N. IEDM Technical Digest. 249:1998.
5. Dodabalapur A., Torsi L., Katz H.E. Science, New Series. 268:1995;270-271.
6. Forrest S.R., Burrows P.E., Haskal E.I., So F.F. Physical Review B (Condensed Matter). 49:1994;11309-11321.
7. Biscarini F., Zamboni R., Samon P., Ostoja P., Taliani C. Physical Review B (Condensed Matter). 52:1995;14868-14877.
8. Fenter P., Schreiber F., Zhou L., Eisenberger P., Forrest S.R. Physical Review B (Condensed Matter). 56:1997;3046-3053.
9. Brinkmann M., Biscarini F., Taliani C., Aiello I., Ghedini M. Physical Review B (Condensed Matter). 61:2000;R16339-16342.
10. Meyer zu Heringdorf F.J., Reuter M.C., Tromp R.M. Nature. 412:2001;517-520.
11. Durr A.C., et al. Physical Review Letters. 90:2003;016104/1-4.
12. Ruiz R., et al. Physical Review Letters. 91:2003;136102/1-4.
13. Ruiz R., et al. Physical Review B (Condensed Matter and Materials Physics). 67:2003;125406-1-7.
14. Swiggers M.L., et al. Applied Physics Letters. 79:2001;1300-1302.
15. Doremus R.H. Glass Science. 1994;John Wiley and Sons Inc. New York. Chapter 11.
16. Shin K., Hu X., Zheng X., Rafailovich M.H., Sokolov J., Zaitsev V., Schartz S.A. Macromolecules. 34:2001;4993.
17. Dimitrakopoulos C.D., Brown A.R., Pomp A. Journal of Applied Physics. 80:1996;2501-2508.
18. Campbell R.B., Robertson J.M., Trotter J. Acta Crystallographica. 14:1961;705-711.
19. Shtein M., Mapel J., Benziger J.B., Forrest S.R. Applied Physics Letters. 81:2002;268-270.
20. Knipp D., Street R.A., Volkel A., Ho J. Journal of Applied Physics. 93:2003;347-355.
21. Ruiz R., et al. Moss S.C. Organic Optoelectronic Materials, Processing and Devices. Symposium. Materials Research Society Symposium Proceedings. vol. 708:2002;415-421 Materials Research Society, Warrendale, PA.
22. Warren B.E. X-Ray Diffraction. 1969;Addison-Wesley, Reading, Mass.
23. Woll A.R., Headrick R.L., Kycia S., Brock J.D. Physical Review Letters. 83:1999;4349-4352.
24. Malis O., Brock J.D., Headrick R.L., Yi M.-S., Pomeroy J.M. Physical Review B (Condensed Matter and Materials Physics). 66:2002;035408/1-9.
25. Cohen P.I., Petrich G.S., Pukite P.R., Whaley G.J., Arrott A.S. Surface Science. 216:1989;222-248.
26. Schwoebel R.L., Shipsey E.J. Journal of Applied Physics. 37:1966;3682.
27. Blackman J.A., Wilding A. Europhysics Letters. 16:1991;115-120.
28. Amar J.G., Family F., Lam P.-M. Physical Review B (Condensed Matter). 50:1994;8781-8797.
29. Meakin P. Physical Review A (General Physics). 27:1983;1495-1507.
30. Witten T.A. Jr., Sander L.M. Physical Review Letters. 47:1981;1400-1403.
31. Kiessig H. Annals of Physics. 5:1931;769.