Bulk and surface plasmon excitations in amorphous carbon measured by core-level photoelectron spectroscopy

Applied Surface Science

Volumn 255, Issue 13-14, 2009, Pages 6598-6606

  Godet, Christian ^a   David, Denis ^b   Sabbah, Hussein ^a   Ababou Girard, Soraya ^a   Solal, Francine ^a  

^a UNIVERSITÉ DE RENNES 1   (France)

^b FEDERAL UNIVERSITY OF BAHIA   (Brazil)

Author keywords

Amorphous carbon; Organic molecular layer; Plasmon; XPS

Indexed keywords

AMORPHOUS CARBON; AMORPHOUS FILMS; CARBON FILMS; GRAFTING (CHEMICAL); ORGANIC CARBON; PHOTOELECTRONS; PHOTONS; PLASMONS; PROBABILITY DISTRIBUTIONS; SURFACE PLASMONS; X RAY PHOTOELECTRON SPECTROSCOPY;

AMORPHOUS CARBON (A-C); CORE-LEVEL PHOTOELECTRON SPECTROSCOPY; COVALENT IMMOBILIZATION; HIGH-ELECTRON-DENSITY; MOLECULAR LAYER; PARAMETERIZATION METHOD; SURFACE PLASMON EXCITATION; X RAY PHOTOELECTRON SPECTRA;

CORE LEVELS;

EID: 63449142718     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.02.050     Document Type: Article

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