Theoretical study of the surface excitation parameter from reflection-electron-energy-loss spectra

Surface and Interface Analysis

Volumn 37, Issue 13, 2005, Pages 1151-1157

  Pauly, N ^a   Tougaard, S ^b   Yubero, F ^c  

^a UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

^b UNIVERSITY OF SOUTHERN DENMARK   (Denmark)

^c INSTITUTO DE CIENCIA DE MATERIALES DE SEVILLA   (Spain)

Author keywords

Al; REELS; Si; Surface excitation; Surface plasmon

Indexed keywords

ALUMINUM; COMPUTER SOFTWARE; DIELECTRIC MATERIALS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; INTERFACES (MATERIALS); SILICON;

DIELECTRIC FUNCTION; SURFACE EXCITATION; SURFACE EXCITATION PARAMETER (SEP); SURFACE PLASMON;

SURFACE CHEMISTRY;

EID: 29044439091     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.2126     Document Type: Article

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