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Journal of Electron Spectroscopy and Related Phenomena

Volumn 136, Issue 3, 2004, Pages 239-245

In situ photoelectron spectroscopy analysis of tetrahedral amorphous carbon films

(3) Reinke, P a Garnier, M G b Oelhafen, P b

a University of Virginia (United States)

b UNIVERSITY OF BASEL (Switzerland)

Author keywords

Carbon films; Photoelectron spectroscopy; Tetrahedral amorphous

Indexed keywords

BINDING ENERGY; CARBON; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; FILM GROWTH; HYDROGEN; RAMAN SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

CARBON FILMS; OXYGEN CONTAMINATION; TETRAHEDRAL AMORPHOUS; ULTRAVIOLET REGIME (UPS);

AMORPHOUS FILMS;

EID: 3142628367 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2004.05.002 Document Type: Article

Times cited : (20)

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