Background subtraction III - the application of REELS data to background removal in AES and XPS

Surface Science

Volumn 471, Issue 1-3, 2001, Pages 185-202

  Seah, M P ^a  

^a Ctr for Mat Msrmt and Technology   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COPPER; ELECTRON SCATTERING; TIN; X RAY PHOTOELECTRON SPECTROSCOPY;

DECONVOLUTION; REFLECTED ELECTRON ENERGY LOSS SPECTROSCOPY (REELS);

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 0035154782     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00906-7     Document Type: Article

References (27)

1. Seah M.P. Surf. Sci. 420:1999;285.
2. Tougaard S. J. Vac. Sci. Technol. A. 5:1987;1275.
3. Tougaard S. Solid State Commun. 61:1987;547.
4. H. Raether, Springer Tracts in Modern Physics, vol. 88, Excitation of Plasmons and Interband Transitions by Electrons, Springer, Berlin, 1980.
5. Tougaard S., Kraaer J. Phys. Rev. B. 43:1991;1651.
6. Jansson C., Hansen H.S., Yubero F., Tougaard S. J. Electron Spectrosc. 60:1992;301.
7. Seah M.P., Gilmore I.S., Spencer S.J. Surf. Sci. 461:2000;1.
8. M.P. Seah, I.S. Gilmore, S.J. Spencer, submitted for publication.
9. Seah M.P. Appl. Surf. Sci. 144-145:1999;161.
10. Seah M.P. J. Electron Spectrosc. 100:1999;55.
11. Seah M.P., Gilmore I.S. J. Vac. Technol. 14:1996;1401.
12. Madden H.H., Zehner D.M., Noonan J.R. Phys. Rev. B. 17:1978;3074.
13. Nebesny K.W., Armstrong N.R. J. Electron Spectrosc. 37:1986;355.
14. Barlow S.M., Bayat-Mokhtari P., Gallon T.E. J. Phys. C: Solid State Phys. 12:1979;5577.
15. Seah M.P. Surf. Interface Anal. 24:1996;830.
16. Seah M.P., Gilmore I.S. Surf. Interface Anal. 26:1998;908.
17. A. Jablonski, S. Tougaard, NIST Elastic-Electron-Scattering Cross-Section Database, Standard Reference Database 64, Version 1.0, NIST, Gaithersburg, MD, 1996.
18. Werner W.S.M., Tilinin I.S., Hayek M. Phys. Rev. B. 50:1994;4819.
19. Seah M.P., Tosa M. Surf. Interface Anal. 18:1992;240.
20. Seah M.P. Surf. Interface Anal. 23:1995;729.
21. Seah M.P., Gilmore I.S., Spencer S.J. J. Electron Spectrosc. 104:1999;73.
22. Seah M.P. J. Electron Spectrosc. 71:1995;191.
23. NPL Auger Electron Spectrometer Intensity Calibration Software, A.1; NPL X-ray Photoelectron Spectrometer Intensity Calibration Software, X.1; http://www.npl.co.uk/npl/cmmt/sis/index.html.
24. Shirley D.A. Phys. Rev. B. 5:1972;4709.
25. Ritchie R.H. Phys. Rev. 106:1957;874.
26. Cohen Simonsen A., Yubero F., Tougaard S. Surf. Sci. 436:1999;149.
27. Yubero F., Sanz J.M., Ramskov B., Tougaard S. Phys. Rev. B. 53:1996;9719.