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Volumn 38, Issue 4, 2006, Pages 672-675
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Theoretical determination of the surface excitation parameter from X-ray photoelectron spectroscopy
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Author keywords
Al; SEP; Si; Surface excitation; Surface plasmon; XPS
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Indexed keywords
ALUMINUM;
DIELECTRIC PROPERTIES;
PARAMETER ESTIMATION;
PHOTOELECTRON SPECTROSCOPY;
SILICON;
SPECTRUM ANALYSIS;
SURFACE PLASMON RESONANCE;
X RAY PHOTOELECTRON SPECTROSCOPY;
DIELECTRIC FUNCTIONS;
REFLECTION-ELECTRON-ENERGY-LOSS SPECTROSCOPY (REELS);
STATIC CORE HOLES;
SURFACE EXCITATION;
SURFACE EXCITATION PARAMETER (SEP);
SURFACE PLASMONS;
SURFACE CHEMISTRY;
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EID: 33646583868
PISSN: 01422421
EISSN: 10969918
Source Type: Journal
DOI: 10.1002/sia.2173 Document Type: Conference Paper |
Times cited : (8)
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References (24)
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