Microstructures of phases in indented silicon: A high resolution characterization

Applied Physics Letters

Volumn 82, Issue 6, 2003, Pages 874-876

  Zarudi, I ^a   Zou, J ^a   Zhang, L C ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTALLINE MATERIALS; HIGH RESOLUTION ELECTRON MICROSCOPY; INDENTATION; MICROSTRUCTURE; PLASTIC DEFORMATION; SHEAR STRESS; TRANSMISSION ELECTRON MICROSCOPY;

INDENTED SILICON;

SILICON;

EID: 0037428686     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1544429     Document Type: Article

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