Diagnosis of Byzantine open-segment faults [scan testing]

Proceedings of the Asian Test Symposium

Volumn 2002-January, Issue , 2002, Pages 248-253

  Huang, Shi Yu ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Circuit faults; Circuit simulation; Fault diagnosis; Flip flops; Inspection; Pulp manufacturing; Signal processing; Silicon; Testing; Wire

Indexed keywords

CIRCUIT SIMULATION; FAILURE ANALYSIS; FLIP FLOP CIRCUITS; INSPECTION; SIGNAL PROCESSING; SILICON; TESTING; WIRE;

BENCHMARK CIRCUIT; CIRCUIT FAULTS; PULP MANUFACTURING; SCAN FLIP-FLOPS; SCAN TESTING; SILICON INSPECTIONS; STUCK-OPEN FAULTS; SYMBOLIC SIMULATION;

FAULT DETECTION;

EID: 84949816712     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2002.1181719     Document Type: Conference Paper

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