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Volumn 84, Issue 22, 2004, Pages 4469-4471
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Ultrasensitive nanoelectromechanical mass detection
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Author keywords
[No Author keywords available]
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Indexed keywords
FLEXURAL RESONANCE FREQUENCIES;
NANOELECTROMECHANICAL SYSTEMS (NEMS);
TEMPERATURE FLUCTUATIONS;
THERMALIZATION;
ADSORPTION;
ELECTRIC RESISTANCE;
FLUXES;
NATURAL FREQUENCIES;
PHASE LOCKED LOOPS;
RESONATORS;
SCANNING ELECTRON MICROSCOPY;
SENSORS;
SILICON CARBIDE;
SPURIOUS SIGNAL NOISE;
TRANSDUCERS;
ULTRAHIGH VACUUM;
MICROELECTROMECHANICAL DEVICES;
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EID: 3042783205
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1755417 Document Type: Article |
Times cited : (595)
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References (20)
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