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Volumn 84, Issue 22, 2004, Pages 4469-4471

Ultrasensitive nanoelectromechanical mass detection

Author keywords

[No Author keywords available]

Indexed keywords

FLEXURAL RESONANCE FREQUENCIES; NANOELECTROMECHANICAL SYSTEMS (NEMS); TEMPERATURE FLUCTUATIONS; THERMALIZATION;

EID: 3042783205     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1755417     Document Type: Article
Times cited : (595)

References (20)
  • 9
    • 3042853647 scopus 로고    scopus 로고
    • Attogram-scale mass sensing is described, U. S. Patent 6,722,200 20 April
    • Attogram-scale mass sensing is described in M. L. Roukes, and K. L. Ekinci, U. S. Patent 6,722,200 (20 April 2004).
    • (2004)
    • Roukes, M.L.1    Ekinci, K.L.2
  • 12
    • 3042733969 scopus 로고    scopus 로고
    • note
    • tot is the total resonator mass (see later discussion in the text).
  • 14
    • 3042811932 scopus 로고    scopus 로고
    • note
    • Following standard practice, the mass noise floor is defined as the added mass that will generate a frequency shift resolvable above the frequency noise floor, i.e., with signal-to-noise ratio∼1.
  • 16
    • 3042858423 scopus 로고    scopus 로고
    • note
    • The thermalization rate between the electrons and the phonons is very short compared to any of the time scales in our experiments.
  • 19
    • 3042814166 scopus 로고    scopus 로고
    • note
    • There is no loss of generality in this approach. Following standard analysis, the electrical noise from the transducers and subsequent stages in the readout chain can be subsumed into an "effective" voltage noise at the transducer. The VCO separately contributes to the observed frequency noise, but its measured phase noise is negligible in this work.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.