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Volumn , Issue , 2004, Pages 377-384

Cantilever microbeams: Modelling of the dynamical behaviour and material characterization

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; COMPOSITE MICROMECHANICS; COMPOSITION; ELASTIC MODULI; FINITE ELEMENT METHOD; MICROELECTROMECHANICAL DEVICES; NATURAL FREQUENCIES; OPTICAL SYSTEMS; POLYCRYSTALLINE MATERIALS; PRESSURE EFFECTS; THICKNESS MEASUREMENT; VIBRATION CONTROL;

EID: 3843082844     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (13)

References (19)
  • 1
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  • 4
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    • Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope
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    • Sader, J.E.1
  • 10
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    • An automated interferometric system for bulge test and blister test measurements of micromachined membranes
    • Yahiaoui R, Danaie K, Petitgrand S, Bosseboeuf A, An Automated interferometric system for bulge test and blister test measurements of micromachined membranes. Proc. SPIE 2001; 4400: 160-169
    • (2001) Proc. SPIE , vol.4400 , pp. 160-169
    • Yahiaoui, R.1    Danaie, K.2    Petitgrand, S.3    Bosseboeuf, A.4
  • 12
    • 3843099496 scopus 로고    scopus 로고
    • Vibrométrie interférométrique continue et stroboscopique : Application à la caractérisation des modes de vibrations de dispositifs micromécaniques
    • Yahiaoui R, Petitgrand S, Bosseboeuf A, Danaie K, Vibrométrie interférométrique continue et stroboscopique : Application à la caractérisation des modes de vibrations de dispositifs micromécaniques; Revue Nano et Micro Technologies Hermes-Sciences Editions, Volume 1, no3/4, (2000-2001) : 411-435.
    • (2000) Revue Nano et Micro Technologies Hermes-sciences Editions , vol.1 , Issue.3-4 , pp. 411-435
    • Yahiaoui, R.1    Petitgrand, S.2    Bosseboeuf, A.3    Danaie, K.4
  • 13
    • 0022108471 scopus 로고
    • Active feedback stabilisation of a Michelson interferometer using a flexural element
    • White R G, Emmony D C. Active feedback stabilisation of a Michelson interferometer using a flexural element. J Phys E: Sci Instrum 1985; 18 :658-663
    • (1985) J Phys E: Sci Instrum , vol.18 , pp. 658-663
    • White, R.G.1    Emmony, D.C.2
  • 14
    • 0030396286 scopus 로고    scopus 로고
    • Characterization of stress in metallic films on silicon with micromechanical devices
    • Boutry M, Bosseboeuf A, Coffignal G. Characterization of stress in metallic films on silicon with micromechanical devices. Proc. SPIE 1996; 2879:126-134
    • (1996) Proc. SPIE , vol.2879 , pp. 126-134
    • Boutry, M.1    Bosseboeuf, A.2    Coffignal, G.3
  • 15
    • 0034226704 scopus 로고    scopus 로고
    • Tensile testing of fre-standing Cu, Ag and Al thin films and Ag/Cu multilayers
    • H. Huang, F. Spaepen, Tensile testing of fre-standing Cu, Ag and Al thin films and Ag/Cu multilayers'; Acta. Mater Vol.48, (2000), p.3261-3269.
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    • Measurement of residual stresses in a plate using a vibrational technique-application to electrolytic nickel coatings
    • Dec.
    • J-F. Manceau, L. Robert, O. Bastien, C. Oytana, S. Biwersi, « Measurement of residual stresses in a plate using a vibrational technique-application to electrolytic nickel coatings »; Journal-of-Microelectromechanical-Systems. vol.5, no.4; Dec. 1996, p.243-249.
    • (1996) Journal-of-microelectromechanical-systems , vol.5 , Issue.4 , pp. 243-249
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.