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Applied Physics A: Materials Science and Processing

Volumn 95, Issue 1, 2009, Pages 233-239

Real-time X-ray diffraction measurements of structural dynamics and polymorphism in diindenoperylene growth

(6) Kowarik, Stefan a,b Gerlach, Alexander a Sellner, Stefan a Cavalcanti, Leide c Konovalov, Oleg c Schreiber, Frank a

a Institut fur Angewandte Physik (Germany)

b LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

c EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

Author keywords

[No Author keywords available]

Indexed keywords

CELL GROWTH; CORUNDUM; CRYSTAL STRUCTURE; MOLECULAR ORIENTATION; OXIDE FILMS; OXIDES; PHASE TRANSITIONS; POLYMORPHISM; SAPPHIRE; SEMICONDUCTING SILICON COMPOUNDS; SILICA; SILICON COMPOUNDS; STRUCTURAL DYNAMICS;

BULK CRYSTALS; HIGH-TEMPERATURE PHASE; IN PLANES; IN-SITU; LOW-TEMPERATURE PHASE; SILICON-OXIDE SUBSTRATES; SPACE MAPPINGS; SUBSTRATE TEMPERATURES; TEMPERATURE DEPENDENTS; UNIT CELLS; X -RAY SCATTERINGS; X-RAY DIFFRACTION MEASUREMENTS;

SUBSTRATES;

EID: 60749121418 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-008-5012-2 Document Type: Article

Times cited : (47)

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