High structural order in thin films of the organic semiconductor diindenoperylene

Applied Physics Letters

Volumn 81, Issue 12, 2002, Pages 2276-2278

  Durr A C ^a   Schreiber, F ^a,b   Munch M ^b   Karl, N ^b   Krause, B ^a   Kruppa, V ^a   Dosch, H ^a,b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BRAGG REFLECTION; CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; DIFFUSE X-RAY SCATTERING; HIGH ORDER; MOSAICITY; NONCONTACT ATOMIC FORCE MICROSCOPY; ORGANIC SEMICONDUCTOR; STRUCTURAL ORDERS; SURFACE NORMALS; TEM IMAGES;

ATOMIC FORCE MICROSCOPY; MONOLAYERS; SEMICONDUCTING SILICON; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY SCATTERING;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 79956011677     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1508436     Document Type: Article

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