Morphology and thermal stability of metal contacts on crystalline organic thin films

Advanced Materials

Volumn 14, Issue 13-14, 2002, Pages 961-963

  Durr A C ^a,b   Schreiber, F ^a,b   Kelsch, M ^a   Carstanjen, H D ^a,b   Dosch, H ^a,b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPUTER SIMULATION; CRYSTALLINE MATERIALS; DEPOSITION; FILM GROWTH; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); METALS; MONTE CARLO METHODS; MORPHOLOGY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING ORGANIC COMPOUNDS; THERMODYNAMIC STABILITY; TRANSMISSION ELECTRON MICROSCOPY; X RAY SCATTERING;

ORGANIC ELECTRONIC DEVICES;

THIN FILMS;

EID: 0037019390     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4095(20020705)14:13/14<961::AID-ADMA961>3.0.CO;2-X     Document Type: Article

References (15)