Regular stepped structures on clean Si (hhm) 7×7 surfaces

Journal of Applied Physics

Volumn 105, Issue 3, 2009, Pages

  Chaika, A N ^a   Fokin, D A ^a,b   Bozhko, S I ^a   Ionov, A M ^a   Debontridder, F ^b   Dubost, V ^b   Cren, T ^b   Roditchev, D ^b  

^a INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

^b INSTITUT DES NANOSCIENCES DE PARIS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT TREATMENT; SCANNING; SCANNING TUNNELING MICROSCOPY; SILICON; STAIRS; VACUUM;

ATOMIC STRUCTURES; DRIVING FORCES; HIGH-RESOLUTION SCANNING TUNNELING MICROSCOPIES; SELF-ASSEMBLING; THERMAL TREATMENTS;

CRYSTAL ATOMIC STRUCTURE;

EID: 60449091530     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3072667     Document Type: Article

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