Periodic faceting of a Si(113) surface miscut towards [110]

Surface Science

Volumn 411, Issue 1-2, 1998, Pages 70-85

  Yoon, Mirang ^a,c   Mochrie, S G J ^a   Tate, M W ^b,d   Gruner, S M ^b,d   Eikenberry, E F ^b  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b PRINCETON UNIVERSITY   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d Cornell University   (United States)

Author keywords

Silicon; Stepped single crystal surfaces; Surface structure; X ray scattering, diffraction and reflection

Indexed keywords

CRYSTAL ORIENTATION; ELECTROMAGNETIC WAVE REFLECTION; MORPHOLOGY; PHASE SEPARATION; SINGLE CRYSTALS; SURFACE STRUCTURE; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

X RAY REFLECTION;

SEMICONDUCTING SILICON;

EID: 0032136175     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00333-1     Document Type: Article

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