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Journal of Materials Science Letters

Volumn 16, Issue 2, 1997, Pages 174-178

Thickness dependence of refractive index for anodic aluminium oxide films

(2) Chiu, Re Long a,b Chang, Peng Heng a

a NATIONAL CHIAO TUNG UNIVERSITY (Taiwan)

b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ANODIC OXIDATION; DENSITY (SPECIFIC GRAVITY); DEPOSITION; DOPING (ADDITIVES); ELLIPSOMETRY; REFRACTIVE INDEX; THICKNESS MEASUREMENT; THIN FILM DEVICES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

GLASS SUBSTRATES; PROPYLENE GLYCOLS; THIN FILM TRANSISTOR LIQUID CRYSTAL DISPLAY (TFT/LCD);

METALLIC FILMS;

EID: 0030787664 PISSN: 02618028 EISSN: None Source Type: Journal
DOI: 10.1023/A:1018518832762 Document Type: Article

Times cited : (18)

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