Rapid qualitative phase analysis in highly textured thin films by x-ray diffraction

Review of Scientific Instruments

Volumn 79, Issue 4, 2008, Pages

  Borgia, Cesare ^a   Olliges, Sven ^a   Spolenak, Ralph ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; RESIDUAL STRESSES; X RAY DIFFRACTION ANALYSIS;

OUT-OF-PLANE TEXTURED SPECIMENS; PHASE ANALYSIS;

THIN FILMS;

EID: 42949144239     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2907534     Document Type: Article

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