Mechanical behaviour of metallic thin films on polymeric substrates and the effect of ion beam assistance on crack propagation

Acta Materialia

Volumn 53, Issue 2, 2005, Pages 411-417

  George, M ^a   Coupeau, C ^b   Colin, J ^b   Grilhe J ^b  

^a SELLAFIELD LTD   (United Kingdom)

^b Laboratoire de Metallurgie Physique   (France)

Author keywords

Atomic force microscopy; Finite element analysis; Mechanical properties; Thin films

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; CRACK PROPAGATION; DELAMINATION; FINITE ELEMENT METHOD; IN SITU PROCESSING; ION BEAMS; PHYSICAL VAPOR DEPOSITION; POLYMERS; TENSILE STRESS; THIN FILMS;

ADHESION FILMS; FINITE ELEMENT STRESS ANALYSIS; IN SITU ATOMIC FORCE MICROSCOPY; MECHANICAL DAMAGE;

METALLIC FILMS;

EID: 10044257406     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2004.09.036     Document Type: Article

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