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Volumn 311, Issue 3, 2009, Pages 871-874

Numerical modeling of SiC single crystal growth-sublimation and hot-wall epitaxy

Author keywords

A1. Computer simulation; A1. Heat transfer; A2. Growth from vapor; A2. Single crystal growth; A3. Chemical vapor deposition processes; B2. Semiconducting silicon compounds

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CHLORINE; COMPUTER SIMULATION; CONTROL SYSTEM ANALYSIS; CONTROL THEORY; CRYSTAL GROWTH; CRYSTALLIZATION; GRAIN BOUNDARIES; GROWTH (MATERIALS); HEAT EXCHANGERS; HEAT TRANSFER; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SILICON CARBIDE; SILICON COMPOUNDS; SINGLE CRYSTALS; SUBLIMATION; THERMOANALYSIS; VAPORS;

EID: 59749105555     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2008.09.105     Document Type: Article
Times cited : (13)

References (17)
  • 2
    • 33750318488 scopus 로고    scopus 로고
    • Choyke W.J., Matsunami H., and Pensil G. (Eds), Springer, Berlin, New York
    • Schöner A. In: Choyke W.J., Matsunami H., and Pensil G. (Eds). Silicon Carbide (2003), Springer, Berlin, New York 229
    • (2003) Silicon Carbide , pp. 229
    • Schöner, A.1
  • 9
    • 59749103653 scopus 로고    scopus 로고
    • Flux-Expert, SIMULOG, France
    • Flux-Expert, SIMULOG, France.
  • 10
    • 59749099474 scopus 로고    scopus 로고
    • CFD-ACE+, CFDRC, AL, USA.
    • CFD-ACE+, CFDRC, AL, USA.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.