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Volumn 104, Issue 12, 2008, Pages

Extensive analysis of resistance evolution due to electromigration induced degradation

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; COPPER; DEGRADATION; GROWTH (MATERIALS); GROWTH KINETICS; QUALITY ASSURANCE;

EID: 58149216189     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3043798     Document Type: Article
Times cited : (59)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.