Imaging buried organic islands by spatially resolved ballistic electron emission spectroscopy

Nanotechnology

Volumn 19, Issue 44, 2008, Pages

  Goh, Kuan Eng J ^a   Bannani, A ^a,b   Troadec, C ^a  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^b UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SPECTROSCOPY; AUGER ELECTRON SPECTROSCOPY; BALLISTICS; BUILDING MOVING; ELECTRON EMISSION; MOLECULAR SPECTROSCOPY; SCHOTTKY BARRIER DIODES; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SPECTRUM ANALYSIS;

BALLISTIC ELECTRON EMISSION SPECTROSCOPIES; BARRIER HEIGHTS; INTERFACE MODIFICATIONS; LOCAL BARRIER HEIGHTS; PENTACENE FILMS; SCHOTTKY; SI(111); SPATIALLY RESOLVED; TUNNELING BARRIERS;

EMISSION SPECTROSCOPY;

GOLD; ORGANIC COMPOUND; SILICONE;

ARTICLE; BALLISTICS; ELECTRIC CURRENT; ELECTRON TRANSPORT; FILM; FLAME PHOTOMETRY; IMAGING SYSTEM; PRIORITY JOURNAL; ROOM TEMPERATURE; SIGNAL NOISE RATIO;

EID: 58149214242     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/44/445718     Document Type: Article

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