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European Physical Journal B

Volumn 55, Issue 1, 2007, Pages 29-36

BEEM spectra of various Au-Si samples and their analysis

(4) Thiaville, A a Caud, F a Vouille, C a Miltat, J a

a UNIVERSITÉ PARIS SUD (France)

Author keywords

[No Author keywords available]

Indexed keywords

BALLISTIC ELECTRON EMISION MICROSCOPY; HOT-ELECTRON TRANSMISSION; PHASE-SPACE MODELS; SCHOTTKY BARRIER HEIGHT;

DATA REDUCTION; DEPOSITION; MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION; SCHOTTKY BARRIER DIODES; THRESHOLD VOLTAGE;

METALLIC FILMS;

EID: 33847298106 PISSN: 14346028 EISSN: 14346036 Source Type: Journal
DOI: 10.1140/epjb/e2007-00037-3 Document Type: Article

Times cited : (5)

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