Role of interface microstructure in rectifying metal/semiconductor contacts: Ballistic electron emission observations correlated to microstructure

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1238-1242

  Morgan, Brent A ^a   Ring, Ken M ^a   Kavanagh, Karen L ^a   Talin, A Alec ^b   Williams, R Stanley ^b   Yasuda, Takashi ^c   Yasui, Takanari ^c   Segawa, Yusaburo ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000270141     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588523     Document Type: Article

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