Ballistic emission spectroscopy and imaging of a buried metalorganic interface

Applied Physics Letters

Volumn 86, Issue 7, 2005, Pages 1-3

  Troadec, Cedric ^a   Kunardi, Linda ^a   Chandrasekhar, N ^a,b  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; CONFORMATIONS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON ENERGY LEVELS; IMAGING TECHNIQUES; ORGANIC POLYMERS; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SILVER; TRANSMISSION ELECTRON MICROSCOPY;

BALLISTIC ELECTRON EMISSION MICROSCOPY (BEEM); BALLISTIC HOLE ELECTRON SPECTROSCOPY (BHES); METAL/ORGANIC INTERFACE; SCHOTTKY BARRIER;

INTERFACES (MATERIALS);

EID: 17044425956     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1862789     Document Type: Article

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