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Volumn , Issue , 2007, Pages 1436-1441

Soft error rate analysis for sequential circuits

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT SIMULATION; ELECTRIC FAULT CURRENTS; SEQUENTIAL CIRCUITS; TRANSIENT ANALYSIS; VOLTAGE CONTROL;

EID: 34548139866     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2007.364500     Document Type: Conference Paper
Times cited : (37)

References (12)
  • 1
    • 15044363155 scopus 로고    scopus 로고
    • Robust System Design with Built-in Soft-Error Resilience
    • February
    • S. Mitra, N. Seifert, M. Zhang, Q. Shi, and K. S. Kim. Robust System Design with Built-in Soft-Error Resilience. In IEEE Computer Magazine, Vol. 28, No. 2, pp. 43-52, February 2005.
    • (2005) In IEEE Computer Magazine , vol.28 , Issue.2 , pp. 43-52
    • Mitra, S.1    Seifert, N.2    Zhang, M.3    Shi, Q.4    Kim, K.S.5
  • 2
    • 21244491597 scopus 로고    scopus 로고
    • Soft Errors in Advanced Computer Systems
    • R. C. Baumann. Soft Errors in Advanced Computer Systems. In IEEE Design and Test of Computers, Vol. 22, Issue 3, 2005.
    • (2005) IEEE Design and Test of Computers , vol.22 , Issue.3
    • Baumann, R.C.1
  • 3
    • 0036931372 scopus 로고    scopus 로고
    • P. Shivakumar, M. Kistler, S. W. Keckler, D. Burger, and L. Alvisi. Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic. In Proc. of International Conference on Dependable Systems and Networks, pp. 389-398, 2002.
    • P. Shivakumar, M. Kistler, S. W. Keckler, D. Burger, and L. Alvisi. Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic. In Proc. of International Conference on Dependable Systems and Networks, pp. 389-398, 2002.
  • 4
    • 0029732375 scopus 로고    scopus 로고
    • IBM experiments in Soft Fails in Computer Electronics (1978-1994)
    • J. F. Ziegler et al. IBM experiments in Soft Fails in Computer Electronics (1978-1994). In IBM Journal of Research and Development, Vol 40, pp. 3-18, 1996.
    • (1996) In IBM Journal of Research and Development , vol.40 , pp. 3-18
    • Ziegler, J.F.1
  • 6
    • 28444491771 scopus 로고    scopus 로고
    • G. Asadi and M. B. Tahoori. Soft Error Modeling and Protection for Sequential Elements. In Proc. of IEEE Symposium on Defect and Fault Tolerance (DFT) in VLSI Systems, pp. 463-471, October 2005.
    • G. Asadi and M. B. Tahoori. Soft Error Modeling and Protection for Sequential Elements. In Proc. of IEEE Symposium on Defect and Fault Tolerance (DFT) in VLSI Systems, pp. 463-471, October 2005.
  • 7
    • 0038721289 scopus 로고    scopus 로고
    • Basic Mechanisms and Modeling of Single-Event Upset in Digital Microelectronics
    • June
    • P. Dodd. Basic Mechanisms and Modeling of Single-Event Upset in Digital Microelectronics. In Proc. of the IEEE Transactions on Nuclear Science, Vol. 50, No. 3, pp. 583-602, June 2003.
    • (2003) In Proc. of the IEEE Transactions on Nuclear Science , vol.50 , Issue.3 , pp. 583-602
    • Dodd, P.1
  • 10
    • 0029379466 scopus 로고    scopus 로고
    • C. Y. Tsui, J. Monteiro, M. Pedram, S. Devadas, and A. M. Despain. Power Estimation Methods for Sequential Logic Circuits. In Proc. of the IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 3, No. 3, pp. 404-416, September 1995.
    • C. Y. Tsui, J. Monteiro, M. Pedram, S. Devadas, and A. M. Despain. Power Estimation Methods for Sequential Logic Circuits. In Proc. of the IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 3, No. 3, pp. 404-416, September 1995.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.