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Volumn 311, Issue 1, 2008, Pages 54-58
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Large-grained oriented polycrystalline silicon thin films prepared by nickel-silicide-induced crystallization
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Author keywords
A1. Optical microscopy; A1. Recrystallization; A1. X ray diffraction; A2. Seed crystals; B2. Semiconducting silicon; B3. Solar cells
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Indexed keywords
AMORPHOUS MATERIALS;
AMORPHOUS SILICON;
BORON;
CRYSTALLIZATION;
CRYSTALS;
DIFFRACTION;
DOPING (ADDITIVES);
FILM GROWTH;
NANOCRYSTALLINE ALLOYS;
NICKEL;
NICKEL ALLOYS;
NICKEL COMPOUNDS;
NONMETALS;
OPTICAL DATA STORAGE;
OPTICAL INSTRUMENTS;
OPTICAL MICROSCOPY;
PHOSPHORUS;
PHOTOVOLTAIC CELLS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
POLYCRYSTALLINE MATERIALS;
POLYSILICON;
RECRYSTALLIZATION (METALLURGY);
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING SILICON;
SEMICONDUCTING SILICON COMPOUNDS;
SEMICONDUCTOR GROWTH;
SILICIDES;
SOLAR CELLS;
SOLAR EQUIPMENT;
THIN FILMS;
X RAY ANALYSIS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
A1. OPTICAL MICROSCOPY;
A1. RECRYSTALLIZATION;
A1. X-RAY DIFFRACTION;
A2. SEED CRYSTALS;
B2. SEMICONDUCTING SILICON;
B3. SOLAR CELLS;
AMORPHOUS FILMS;
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EID: 57649217599
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2008.10.027 Document Type: Article |
Times cited : (6)
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References (26)
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