메뉴 건너뛰기




Volumn 290, Issue 2, 2006, Pages 379-383

The effect of dopants on the microstructure of polycrystalline silicon thin film grown by MILC method

Author keywords

A1. Dopant effect; A1. FE SEM; A3. MILC; A3. Unidirectional parallel growth; B1. a Si; B1. Poly Si

Indexed keywords

CRYSTALLIZATION; FILM GROWTH; POLYCRYSTALLINE MATERIALS; POLYSILICON; THIN FILMS;

EID: 33646375215     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.01.060     Document Type: Article
Times cited : (13)

References (11)
  • 1
    • 0030128485 scopus 로고    scopus 로고
    • Low temperature poly-Si thin-film transistor fabrication by metal-induced lateral crystallization
    • Lee S.W., and Joo S.K. Low temperature poly-Si thin-film transistor fabrication by metal-induced lateral crystallization. IEEE Electron Device Lett. 17 4 (1996) 160
    • (1996) IEEE Electron Device Lett. , vol.17 , Issue.4 , pp. 160
    • Lee, S.W.1    Joo, S.K.2
  • 2
    • 0001142560 scopus 로고    scopus 로고
    • Excimer laser annealing of amorphous and solid-phase-crystallized silicon films
    • Miyasaka M., and Stoemenos J. Excimer laser annealing of amorphous and solid-phase-crystallized silicon films. J. Appl. Phys. 86 10 (1999) 5556
    • (1999) J. Appl. Phys. , vol.86 , Issue.10 , pp. 5556
    • Miyasaka, M.1    Stoemenos, J.2
  • 3
    • 0032672503 scopus 로고    scopus 로고
    • A study on the leakage current of poly-Si TFTs fabricated by metal induced lateral crystallization
    • Ihn T.H., Kim T.K., Lee B.I., and Joo S.K. A study on the leakage current of poly-Si TFTs fabricated by metal induced lateral crystallization. Microelecron. Reliab. 39 (1999) 53
    • (1999) Microelecron. Reliab. , vol.39 , pp. 53
    • Ihn, T.H.1    Kim, T.K.2    Lee, B.I.3    Joo, S.K.4
  • 5
    • 36449004575 scopus 로고
    • Silicide formation and silicide-mediated crystallization of nickel-implanted amorphous silicon thin films
    • Hayzelden C., and Batstone J.L. Silicide formation and silicide-mediated crystallization of nickel-implanted amorphous silicon thin films. J. Appl. Phys. 73 12 (1993) 8279
    • (1993) J. Appl. Phys. , vol.73 , Issue.12 , pp. 8279
    • Hayzelden, C.1    Batstone, J.L.2
  • 6
    • 0037250142 scopus 로고    scopus 로고
    • A model for crystal growth during metal induced lateral crystallization of amorphous silicon
    • Jopshi A.R., Krishnamohan T., and Saraswat K. A model for crystal growth during metal induced lateral crystallization of amorphous silicon. J. Appl. Phys. 93 1 (2003) 175
    • (2003) J. Appl. Phys. , vol.93 , Issue.1 , pp. 175
    • Jopshi, A.R.1    Krishnamohan, T.2    Saraswat, K.3
  • 7
    • 0036469346 scopus 로고
    • Dopant and thickness dependence of metal-induced lateral crystallization of amorphous silicon films
    • Ma T., and Wong M. Dopant and thickness dependence of metal-induced lateral crystallization of amorphous silicon films. J. Appl. Phys. 91 3 (1993) 1236
    • (1993) J. Appl. Phys. , vol.91 , Issue.3 , pp. 1236
    • Ma, T.1    Wong, M.2
  • 9
    • 3142561382 scopus 로고    scopus 로고
    • Electric-field-enhanced crystallization of amorphous silicon
    • Jang J., Oh J.Y., Kim S.K., Choi Y.J., Yoon S.Y., and Kim C.O. Electric-field-enhanced crystallization of amorphous silicon. Nature 395 (1998) 481
    • (1998) Nature , vol.395 , pp. 481
    • Jang, J.1    Oh, J.Y.2    Kim, S.K.3    Choi, Y.J.4    Yoon, S.Y.5    Kim, C.O.6
  • 11
    • 0022580759 scopus 로고
    • Impurity-induced enhancement of the growth rate of amorphized silicon during solid-phase epitaxy: a free carrier effect
    • Licoppe C., and Nissim Y.I. Impurity-induced enhancement of the growth rate of amorphized silicon during solid-phase epitaxy: a free carrier effect. J. Appl. Phys. 59 2 (1986) 432
    • (1986) J. Appl. Phys. , vol.59 , Issue.2 , pp. 432
    • Licoppe, C.1    Nissim, Y.I.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.