Roadmap for CMOS image sensors: Moore meets planck and sommerfeld

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5678, Issue , 2005, Pages 1-13

  Catrysse, Peter B ^a   Wandell, Brian A ^a  

^a Stanford University   (United States)

Author keywords

Diffraction; Image sensor; Imaging lens; Microlens; Photon noise

Indexed keywords

ACTIVE PIXEL SENSOR (APS); IMAGING LENS; PHOTON NOISE; SINGLE LENS REFLEX (SLR);

CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; COMPUTER SOFTWARE; DIFFRACTION; IMAGE QUALITY; IRRADIATION; MICROLENSES; PHOTONS; PHOTOSENSITIVITY; SIGNAL TO NOISE RATIO;

IMAGE SENSORS;

EID: 21844469252     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.592483     Document Type: Conference Paper

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