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Volumn 372, Issue 48, 2008, Pages 7179-7182

Preparation of silicon carbide film by a plasma focus device

Author keywords

Dense plasma focus (DPF); Pulsed electron beam; Silicon carbide (SiC)

Indexed keywords

FIELD EMISSION MICROSCOPES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PLASMA DEVICES; PLASMA THEORY; POROUS SILICON; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE; X RAY DIFFRACTION;

EID: 56049090265     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2008.10.062     Document Type: Article
Times cited : (27)

References (38)
  • 8
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    • 56049111910 scopus 로고    scopus 로고
    • H.R. Yousefi, Z.P. Wang, Y. Nakada, H. Ito, K. Masugata, Application of Plasma Focus device to Material Processes, The 5th Asia-Pacific International Symposium on the Basics and Applications of Plasma Technology, Taiwan, 2007, pp. 179-181
    • H.R. Yousefi, Z.P. Wang, Y. Nakada, H. Ito, K. Masugata, Application of Plasma Focus device to Material Processes, The 5th Asia-Pacific International Symposium on the Basics and Applications of Plasma Technology, Taiwan, 2007, pp. 179-181


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.