-
1
-
-
18544395626
-
Fully-depleted SOI CMOS technology for low-voltage low-power mixed digital/analog/microwave circuits
-
Flandre D., Colinge J.P., Chen J., De Ceuster D., Eggermont J.P., Ferreira L., Gentinne B., Jespers P.G.A., Viviani A., Gillon R., Raskin J.P., Vander Vorst A., Vanhoenacker-Janvier D., and Silveira F. Fully-depleted SOI CMOS technology for low-voltage low-power mixed digital/analog/microwave circuits. Analog Integrated Circuits Signal Process. 21 (1999) 213-228
-
(1999)
Analog Integrated Circuits Signal Process.
, vol.21
, pp. 213-228
-
-
Flandre, D.1
Colinge, J.P.2
Chen, J.3
De Ceuster, D.4
Eggermont, J.P.5
Ferreira, L.6
Gentinne, B.7
Jespers, P.G.A.8
Viviani, A.9
Gillon, R.10
Raskin, J.P.11
Vander Vorst, A.12
Vanhoenacker-Janvier, D.13
Silveira, F.14
-
2
-
-
0030127650
-
Modeling and application of fully depleted SOI MOSFETs for low voltage, low power analogue CMOS circuits
-
Flandre D., Ferreira L.F., Jespers P.G.A., and Colinge J.P. Modeling and application of fully depleted SOI MOSFETs for low voltage, low power analogue CMOS circuits. Solid-State Electron. 39 4 (1996) 455-460
-
(1996)
Solid-State Electron.
, vol.39
, Issue.4
, pp. 455-460
-
-
Flandre, D.1
Ferreira, L.F.2
Jespers, P.G.A.3
Colinge, J.P.4
-
4
-
-
1442287310
-
Laterally asymmetric channel engineering in fully depleted double gate SOI MOSFETs for high performance analog applications
-
Kranti A., Chung T.M., Flandre D., and Raskin J.P. Laterally asymmetric channel engineering in fully depleted double gate SOI MOSFETs for high performance analog applications. Solid-State Electron. 48 6 (2004) 947-959
-
(2004)
Solid-State Electron.
, vol.48
, Issue.6
, pp. 947-959
-
-
Kranti, A.1
Chung, T.M.2
Flandre, D.3
Raskin, J.P.4
-
6
-
-
33646023723
-
Analog/RF performance of multiple gate SOI devices: wideband simulations and characterization
-
Raskin J.P., Chung T.M., Kilchytska V., Lederer D., and Flandre D. Analog/RF performance of multiple gate SOI devices: wideband simulations and characterization. IEEE Trans. Electron Devices 53 5 (2006) 1088-1095
-
(2006)
IEEE Trans. Electron Devices
, vol.53
, Issue.5
, pp. 1088-1095
-
-
Raskin, J.P.1
Chung, T.M.2
Kilchytska, V.3
Lederer, D.4
Flandre, D.5
-
7
-
-
0033736623
-
Graded-channel fully depleted silicon-on-insulator nMOSFET for reducing the parasitic bipolar effects
-
Pavanello M.A., Martino J.A., and Flandre D. Graded-channel fully depleted silicon-on-insulator nMOSFET for reducing the parasitic bipolar effects. Solid-State Electron. 44 6 (2000) 917-922
-
(2000)
Solid-State Electron.
, vol.44
, Issue.6
, pp. 917-922
-
-
Pavanello, M.A.1
Martino, J.A.2
Flandre, D.3
-
8
-
-
33847634699
-
-
R.T. Doria, M.A. Pavanello, A. Cerdeira, J.P. Raskin, D. Flandre, Channel length reduction influence on harmonic distortion of graded-channel gate-all-around devices, in: 21st Symposium on Microelectronics Technology and Devices, 2006, pp. 247-256.
-
R.T. Doria, M.A. Pavanello, A. Cerdeira, J.P. Raskin, D. Flandre, Channel length reduction influence on harmonic distortion of graded-channel gate-all-around devices, in: 21st Symposium on Microelectronics Technology and Devices, 2006, pp. 247-256.
-
-
-
-
9
-
-
27744478323
-
High performance analog operation of double-gate transistors with graded-channel architecture at low temperatures
-
Pavanello M.A., Martino J.A., Raskin J.-P., and Flandre D. High performance analog operation of double-gate transistors with graded-channel architecture at low temperatures. Solid-State Electron. 49 10 (2005) 1569-1575
-
(2005)
Solid-State Electron.
, vol.49
, Issue.10
, pp. 1569-1575
-
-
Pavanello, M.A.1
Martino, J.A.2
Raskin, J.-P.3
Flandre, D.4
-
10
-
-
18844377426
-
Advantages of the graded-channel SOI FD MOSFET for application as a quasi-linear resistor
-
Cerdeira A., Alemán M.A., Pavanello M.A., Martino J.A., Vancaillie L., and Flandre D. Advantages of the graded-channel SOI FD MOSFET for application as a quasi-linear resistor. IEEE Trans. Electron Devices 52 5 (2005) 967-972
-
(2005)
IEEE Trans. Electron Devices
, vol.52
, Issue.5
, pp. 967-972
-
-
Cerdeira, A.1
Alemán, M.A.2
Pavanello, M.A.3
Martino, J.A.4
Vancaillie, L.5
Flandre, D.6
-
11
-
-
0036680370
-
Analog circuit design using graded-channel SOI nMOSFETs
-
Pavanello M.A., Martino J.A., and Flandre D. Analog circuit design using graded-channel SOI nMOSFETs. Solid-State Electron. 46 8 (2002) 1215-1225
-
(2002)
Solid-State Electron.
, vol.46
, Issue.8
, pp. 1215-1225
-
-
Pavanello, M.A.1
Martino, J.A.2
Flandre, D.3
-
12
-
-
28044432778
-
Gain improvement in operational transconductance amplifiers using graded-channel SOI nMOSFETs
-
Gimenez S.P., Pavanello M.A., Martino J.A., and Flandre D. Gain improvement in operational transconductance amplifiers using graded-channel SOI nMOSFETs. Microelectron. J. 37 1 (2006) 31-37
-
(2006)
Microelectron. J.
, vol.37
, Issue.1
, pp. 31-37
-
-
Gimenez, S.P.1
Pavanello, M.A.2
Martino, J.A.3
Flandre, D.4
-
13
-
-
0036132410
-
New method for determination of harmonic distortion in SOI FD transistors
-
Cerdeira A., Estrada M., Quintero R., Flandre D., Ortiz-Conde A., and García Sánchez F.J. New method for determination of harmonic distortion in SOI FD transistors. Solid-State Electron. 46 1 (2002) 103-108
-
(2002)
Solid-State Electron.
, vol.46
, Issue.1
, pp. 103-108
-
-
Cerdeira, A.1
Estrada, M.2
Quintero, R.3
Flandre, D.4
Ortiz-Conde, A.5
García Sánchez, F.J.6
-
14
-
-
4544340565
-
Integral function method for determination of nonlinear harmonic distortion
-
Cerdeira A., Alemán M.A., Estrada M., and Flandre D. Integral function method for determination of nonlinear harmonic distortion. Solid-State Electron. 48 12 (2004) 2225-2234
-
(2004)
Solid-State Electron.
, vol.48
, Issue.12
, pp. 2225-2234
-
-
Cerdeira, A.1
Alemán, M.A.2
Estrada, M.3
Flandre, D.4
-
15
-
-
0037560969
-
Influence of device engineering on the analog and RF performances of SOI MOSFETs
-
Kilchytska V., Neve A., Vancaillie L., Levacq D., Adriaensen S., van Meer H., De Meyer K., Raynaud C., Dehan M., Raskin J.P., and Flandre D. Influence of device engineering on the analog and RF performances of SOI MOSFETs. IEEE Trans. Electron Devices 50 3 (2003) 577-588
-
(2003)
IEEE Trans. Electron Devices
, vol.50
, Issue.3
, pp. 577-588
-
-
Kilchytska, V.1
Neve, A.2
Vancaillie, L.3
Levacq, D.4
Adriaensen, S.5
van Meer, H.6
De Meyer, K.7
Raynaud, C.8
Dehan, M.9
Raskin, J.P.10
Flandre, D.11
-
16
-
-
0033353323
-
Gate-all-around OTA's for red-hard and high-temperature analog applications
-
Vandooren A., Colinge J.P., and Flandre D. Gate-all-around OTA's for red-hard and high-temperature analog applications. IEEE Trans. Nucl. Sci. 46 4 (1999) 1242-1249
-
(1999)
IEEE Trans. Nucl. Sci.
, vol.46
, Issue.4
, pp. 1242-1249
-
-
Vandooren, A.1
Colinge, J.P.2
Flandre, D.3
-
17
-
-
56049119186
-
-
Athena Users' Manual, Edition 10, 2004.
-
Athena Users' Manual, Edition 10, 2004.
-
-
-
-
18
-
-
56049118262
-
-
Atlas Users Manual, 2004.
-
Atlas Users Manual, 2004.
-
-
-
-
19
-
-
0033751937
-
Analog performance and applications of graded-channel fully depleted SOI MOSFETs
-
Pavanello M.A., Martino J.A., and Flandre D. Analog performance and applications of graded-channel fully depleted SOI MOSFETs. Solid-State Electron. 44 7 (2000) 1219-1222
-
(2000)
Solid-State Electron.
, vol.44
, Issue.7
, pp. 1219-1222
-
-
Pavanello, M.A.1
Martino, J.A.2
Flandre, D.3
-
22
-
-
27744484542
-
A charge-based continuous model for submicron graded-channel nMOSFET for analog circuit simulation
-
de Souza M., Pavanello M.A., Iñiguez B., and Flandre D. A charge-based continuous model for submicron graded-channel nMOSFET for analog circuit simulation. Solid-State Electron. 49 10 (2005) 1683-1692
-
(2005)
Solid-State Electron.
, vol.49
, Issue.10
, pp. 1683-1692
-
-
de Souza, M.1
Pavanello, M.A.2
Iñiguez, B.3
Flandre, D.4
-
23
-
-
34250757086
-
-
M.A. Pavanello, A. Cerdeira, J.A. Martino, J.P. Raskin, D. Flandre, Impact of asymmetric channel configuration on the linearity of double-gate SOI MOSFETs, in: Proceedings of the 6th ICCDCS, 2006, pp. 187-191.
-
M.A. Pavanello, A. Cerdeira, J.A. Martino, J.P. Raskin, D. Flandre, Impact of asymmetric channel configuration on the linearity of double-gate SOI MOSFETs, in: Proceedings of the 6th ICCDCS, 2006, pp. 187-191.
-
-
-
-
24
-
-
34247537135
-
-
A. Cerdeira, M. Alemán, V. Kilchitska, N. Collaert, K. De Meyer, D. Flandre, Nonlinearity analysis of FinFETs, in: Proceedings of the 6th ICCDCS, 2006, pp. 9-12.
-
A. Cerdeira, M. Alemán, V. Kilchitska, N. Collaert, K. De Meyer, D. Flandre, Nonlinearity analysis of FinFETs, in: Proceedings of the 6th ICCDCS, 2006, pp. 9-12.
-
-
-
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