SCOPUS 정보 검색 플랫폼

Solid-State Electronics

Volumn 46, Issue 1, 2002, Pages 103-108

New method for determination of harmonic distortion in SOI FD transistors

(6) Cerdeira, A a Estrada, M a Quintero, R a Flandre, D b Ortiz Conde, A c Garcia Sanchez F J c

a DEPARTAMENTO DE FÍSICA (Mexico)

b Laboratoire de Microelectronique (Belgium)

c UNIVERSIDAD SIMÓN BOLÍVAR (Venezuela)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; FAST FOURIER TRANSFORMS; HARMONIC DISTORTION; RESISTORS; SILICON ON INSULATOR TECHNOLOGY; TRIODES;

TOTAL HARMONIC DISTORTION (THD);

MOSFET DEVICES;

EID: 0036132410 PISSN: 00381101 EISSN: None Source Type: Journal
DOI: 10.1016/S0038-1101(01)00258-1 Document Type: Article

Times cited : (54)

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7
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9
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.