Direct measurement of transfer functions in kelvin probe force microscopy using artificially patterned surface potentials

Japanese Journal of Applied Physics

Volumn 47, Issue 7 PART 1, 2008, Pages 5630-5635

  Ozasa, Kazunari ^a   Nemoto, Shigeyuki ^a   Isoshima, Takashi ^a   Ito, Eisuke ^a   Maeda, Mizuo ^a   Hara, Masahiko ^a  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

Author keywords

Kelvin probe force microscope (KFM); Point spread function; Surface potential; Transfer function; Tris(8 hydroxyquinolinato)aluminum(III) (Alq3)

Indexed keywords

ALUMINA; FILM PREPARATION; FUNCTIONS; OPTICAL TRANSFER FUNCTION; PROBABILITY DENSITY FUNCTION; SURFACE POTENTIAL; SURFACE PROPERTIES; THICK FILMS; THIN FILMS; TWO DIMENSIONAL;

2D TRANSFER FUNCTIONS; CONDUCTIVE PROBES; DIRECT MEASUREMENTS; KELVIN PROBE FORCE MICROSCOPE (KFM); KELVIN PROBE FORCE MICROSCOPIES; NEGATIVE VALUES; POINT SPREAD FUNCTION; POTENTIAL PROFILES; STEP PATTERNS; TRIS(8- HYDROXYQUINOLINATO)ALUMINUM(III) (ALQ3);

TRANSFER FUNCTIONS;

EID: 55149093199     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.5630     Document Type: Article

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