Contact charging and surface charge measurement using a scanning Kelvin technique

Physica Status Solidi (A) Applied Research

Volumn 178, Issue 2, 2000, Pages 715-719

  Nalbach, M ^a   Kliem, H ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRIC CHARGE MEASUREMENT; ELECTRIC POTENTIAL; ELECTROMECHANICAL DEVICES; ELECTROSTATICS; MICROSCOPES; OSCILLATIONS; VIBRATIONS (MECHANICAL);

SCANNING KELVIN PROBE MICROSCOPES;

PROBES;

EID: 0033743041     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200004)178:2<715::AID-PSSA715>3.0.CO;2-K     Document Type: Article

References (3)

1. I.D. BAIKIE, S. MACKENZIE, P.J.Z. ESTRUP, and J.A. MEYER, Rev. Sci. Instrum. 62, 1326 (1991).
2. B.D. TERRIS, J.E STERN, D. RUGAR, and H.J. MAMIN, Phys. Rev. Lett. 63, 2669 (1989).
3. H. KLIEM, A. HESSLER, and G. ARLT, Conf. Electrical Insulation and Dielectric Phenomena. Annual Report, IEEE Service Center, Piscataway (NJ) 1988 (p. 382).