Measurement of photo-patterned surface potential of Alq3 thin films by Kelvin-force microscope together with near-field optical stimulation

Surface and Interface Analysis

Volumn 40, Issue 3-4, 2008, Pages 810-813

  Ozasa, Kazunari ^a   Nemoto, Shigeyuki ^a   Isoshima, Takashi ^a   Ito, Eisuke ^a   Maeda, Mizuo ^a   Hara, Masahiko ^a  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

Author keywords

Alq3; KFM; Near field; SNOM; Surface potential; Transfer function

Indexed keywords

SURFACE POTENTIAL; TRANSFER FUNCTIONS; VACUUM EVAPORATION;

CONTACT-MASK PHOTO-EXPOSURE; KELVIN-FORCE MICROSCOPE (KFM);

THIN FILMS;

EID: 42449144835     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2669     Document Type: Conference Paper

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