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Volumn 15, Issue 6, 2008, Pages 600-605

An access to buried interfaces: The X-ray reflectivity set-up of BL9 at DELTA

Author keywords

Beamline; Solid liquid interfaces; X ray reflectivity

Indexed keywords

ADSORPTION; FLOW MEASURING INSTRUMENTS; GAS ADSORPTION; REFLECTION; STORAGE RINGS; X RAY DIFFRACTION; X RAY OPTICS;

EID: 54949133646     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049508026745     Document Type: Article
Times cited : (28)

References (47)
  • 43
    • 54949085853 scopus 로고    scopus 로고
    • Tolan, M. (1999). Springer Tracts in Modern Physics, 148, X-ray Scattering from Soft Matter Thin Films. Berlin: Springer.
    • Tolan, M. (1999). Springer Tracts in Modern Physics, Vol. 148, X-ray Scattering from Soft Matter Thin Films. Berlin: Springer.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.