Direct structural observation of a molecular junction by high-energy x-ray reflectometry

Proceedings of the National Academy of Sciences of the United States of America

Volumn 103, Issue 8, 2006, Pages 2541-2545

  Lefenfeld, Michael ^a   Baumert, Julian ^b   Sloutskin, Eli ^c   Kuzmenko, Ivan ^d   Pershan, Peter ^e   Deutsch, Moshe ^c   Nuckolls, Colin ^a   Ocko, Benjamin M ^b  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c BAR ILAN UNIVERSITY   (Israel)

^d ARGONNE NATIONAL LABORATORY   (United States)

^e HARVARD UNIVERSITY   (United States)

Author keywords

molecular electronics; Monolayers; Structure; X ray reflectivity

Indexed keywords

MERCURY; SILICON;

ARTICLE; ELECTRONICS; ENERGY; FOURIER TRANSFORMATION; GEOMETRY; LIQUID; MOLECULAR INTERACTION; MOLECULAR JUNCTION; PRIORITY JOURNAL; REFLECTOMETRY; SOLID; STRUCTURE ANALYSIS; X RAY ANALYSIS;

EID: 33644535453     PISSN: 00278424     EISSN: None     Source Type: Journal    
DOI: 10.1073/pnas.0508070103     Document Type: Article

References (24)

1. Slowinski, K., Chamberlain, R. V., Bilewicz, R. & Majda, M. (1996) J. Am. Chem. Soc. 118, 4709-4710.
2. Hipps, K. W. & Mazur, U. (2002) Inelastic Electron Tunneling Spectroscopy (Wiley, Chichester, U.K.).
3. Hipps, K. W., Dowdy, J. & Hoagland, J. J. (1991) Langmuir 7, 5-7.
4. Nowak, A. M., McCreery, R. L. (2004) J. Am. Chem. Soc. 126, 16621-16631.
5. Jun, Y. & Zhu, X.-Y. (2004) J. Am. Chem. Soc. 126, 13224-13225.
6. Poirier, G. E. (1999) Langmuir 15, 1167-1175.
7. Fenter, P., Eberhardt, A. & Eisenberger, P. (1994) Science 266, 1216-1218.
8. Slowinski, K., Fong, H. K. Y. & Majda, M. (1999) J. Am. Chem. Soc. 121, 7257-7261.
9. Rampi, M. A. & Whitesides, G. M. (2002) Chem. Phys. 281, 373-391.
10. Selzer, Y., Salomon, A.& Cahen, D. (2002) J. Phys. Chem. B. 106, 10432-10439.
11. Liu, Y.-J. & Yu, H.-Z. J. (2003) Chem. Phys. Chem. 4, 335-342.
12. Tulevski, G. S., Miao, Q., Fukuto, M., Abram, R., Ocko, B. M., Pindak, R., Steigerwald, M., Kagan, C. & Nuckolls, C. (2004) J. Am. Chem. Soc. 126, 15048-15050.
13. Kraack, H., Ocko, B. M., Pershan, P. S., Sloutskin, E. & Deutsch M. (2002) Science 298, 1404-1407.
14. Ocko, B. M., Kraack, H., Pershan, P. S., Sloutskin, E., Tamam, L. & Deutsch, M. (2005) Phys. Rev. Lett. 94, 017802.
15. Kaganer, V. M., Möhwald, H. & Dutta, P. (1999) Rev. Mod. Phys. 71, 779-819.
16. Als-Nielsen, J. & McMorrow, D. (2001) Elements of Modern X-Ray Physics (Wiley, New York).
17. Tidswell, I. M., Ocko, B. M., Pershan, P. S., Wasserman, S. R., Whitesides, G. M. & Axe, J. D. (1990) Phys. Rev. B. 41, 1111-1128.
18. Parratt, L. G. (1954) Phys. Rev. 95, 359-369.
19. Magnussen, O. M., Ocko, B. M., Regan, M. J., Penanen, K., Pershan, P. S. & Deutsch, M. (1995) Phys. Rev. Lett. 74, 4444-4447.
20. DiMasi, E., Tostmann, H., Ocko, B. M., Pershan, P. S. & Deutsch, M. (1998) Phys. Rev. B. 58, R13419-R13422.
21. Cutler, W. G., McMickle, R. H., Webb, W. & Schiessler, R. W. (1958)J. Chem. Phys. 29, 727-740.
22. Reichert, H., Honkimaki, V., Snigirev, A., Engemann, S. & Dosch, H. (2003) Physica B 336, 46-55.
23. Maoz, R., Cohen, S. & Sagiv, J. (1999) Adv. Mater. 11, 55-61.
24. Brzoska, J. B., Shahidzadeh, N. & Rondelez, F. (1992) Nature 360, 719-721.